Method and apparatus for feature tracking strain estimation for elastography
US6687625B2 · kind B2 · utility
50Cited by
3References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 22, 2002 |
| Grant date | Feb 3, 2004 |
| Priority date | — |
| Expiry date | Apr 30, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L1/255
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed toward an apparatus and method for determining localized strain in a target body by identifying sets of features in reflected echo sequences and by comparing sets of features to determine time shift values between features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.