Laplace transform impedance spectrometer and its measurement method
US6687631B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2002 |
| Grant date | Feb 3, 2004 |
| Priority date | — |
| Expiry date | Oct 16, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring impedance is based on carrier function Laplace transform. The measurement includes detecting a response signal from a device under test, to which signal an excitation such as a pulse, interrupt or constant load is applied. Resulting data is fitted to a carrier function, selected so as to be capable of providing a good fit and for which an analytical Laplace transform is known, in order to obtain parameters of such function providing best fit. Obtained parameters are further substituted into the analytical expression of Laplace transform of carrier function which is used to calculate a frequency dependent impedance function in the Laplace domain. The resulting impedance function is used for calculating the impedance spectrum in a frequency domain and for calculating the measurement error of the frequency domain impedance spectrum using the standard deviations of the parameters, obtained during fitting of time-domain data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.