Three-dimensional atom microscope, three-dimensional observation method of atomic arrangement, and stereoscopic measuring method of atomic arrangement
US6690007B2 · kind B2 · utility
1Cited by
3References
3Claims
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Key dates
| Filing date | Aug 2, 2001 |
| Grant date | Feb 10, 2004 |
| Priority date | — |
| Expiry date | Oct 1, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/227
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Forward scattering peaks of photoelectrons having different angular momenta is generated by radiating to a sample two rays of circularly polarized light that differ in a rotary direction. Two images of photoelectron diffraction patterns are formed by two-dimensionally detecting the photoelectron diffraction patterns formed with the photoelectron forward scattering peaks. The observer can three-dimensionally observe the structure in an atomic arrangement by observing these photoelectron diffraction pattern images with his or hers right and left eyes, respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.