Laser inspection apparatus
US6690024B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2000 |
| Grant date | Feb 10, 2004 |
| Priority date | — |
| Expiry date | Jul 18, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/95638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser inspection apparatus has a light source 13 for outputting laser beam, application means 5, 33, 34 for irradiating the laser beam 7 output from the light source 13 to any desired position of a detected body 21, first detection means 2 for detecting fluorescence 8 generated from the detected body 21 to which the laser beam 7 is applied, and second detection means 3 for detecting reflected light 8 scattered on a surface of the detected body 21 to which the laser beam 7 is applied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.