Time domain reflectometry measurement instrument
US6690320B2 · kind B2 · utility
34Cited by
5References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 11, 2001 |
| Grant date | Feb 10, 2004 |
| Priority date | — |
| Expiry date | Jun 11, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/88
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.