Methods for generating differential profiles by combining data obtained in separate measurements
US6691042B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2001 |
| Grant date | Feb 10, 2004 |
| Priority date | — |
| Expiry date | Jul 2, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16B25/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention provides methods for generating differential profiles having been subject to condition A vs. condition B (A vs. B) from data obtained in separately performed experimental measurements A vs. C and B vs. D. When C and D are the same, the invention provides methods for determination of systematic measurement errors or biases between different measurements carried out in different experimental reactions, i.e., cross-experiment errors or biases, using data measured for samples under the common condition and for removal or reduction of such cross-experiment errors. The invention further provides methods for generating differential profiles A vs. B from data obtained in single-channel measurements A and B.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.