Digital-to-analog conversion circuitry incorporating a simplified testing circuit
US6693570B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2002 |
| Grant date | Feb 17, 2004 |
| Priority date | — |
| Expiry date | Oct 30, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/66
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Digital-to-analog (DA) conversion circuitry with a simplified testing circuit includes a DA converter to which test data, initially “0”, may be applied. The DA converter feeds an analog voltage corresponding to the test data to a voltage holding circuit. Subsequently the test data is incremented to “1” and then converted to a corresponding analog voltage by the DA converter. A comparator compares the analog voltage corresponding to the test data “1” with the previous analog voltage held in the voltage holding circuit and corresponding to the test data “0”. When the test data is sequentially incremented by 1 (one) at intervals, the voltage output from the DA converter is higher than the voltage held in the voltage holding circuit while the DA converter operates normally. The function of the DA converter can be easily, rapidly tested by monitoring the output of the comparator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.