Determining moisture content of vapor
US6694266B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2002 |
| Grant date | Feb 17, 2004 |
| Priority date | — |
| Expiry date | Jul 31, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process and apparatus for measuring the amount of water in vapor has been developed. The process begins with adjusting the level of water in a vessel housing a capacitance probe so as to immerse from about 5 to about 15 percent of the probe and measuring and recording an initial capacitance, CI. A measured amount of vapor is passed through a condenser, the condensed water is conducted to the vessel and a final capacitance, CF, is measured and recorded. The change in capacitance is calculated, &Dgr;C=(CF−CI), and the difference, &Dgr;C, along with a calculation correlation is used to determine the amount of water condensed. With the amount of water condensed and the measured amount of vapor passed through the vessel, the amount of water in the vapor may be readily calculated. The vapor to be analyzed may be at a temperature as high as about 1000° C.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.