Kit and method for setting probe depth
US6694832B1 · kind B1 · utility
14Cited by
25References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 27, 2003 |
| Grant date | Feb 24, 2004 |
| Priority date | — |
| Expiry date | Feb 27, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A kit is provided to measure the depth to which the tip of a probe should be set inside an assembly such as a combustion can. The acquired depth is then transferred to a set of probes for installation. The fixtures and the associated process ensure that the probe will be in a proper position for accurate measurement and to eliminate inconsistencies in measurement due to probe insertion to different depths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.