Method for determining lifetime for media thermal decay
US6697203B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 2000 |
| Grant date | Feb 24, 2004 |
| Priority date | — |
| Expiry date | May 24, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B27/36
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for determining a lifetime for a medium to fail due to thermal decay of a magnetization pattern is provided. Different stress magnetic fields are applied to a write head for writing to a machine-readable medium resulting in a magnetic field on the medium. A time to failure, corresponding to each of the different stress magnetic fields, is determined, the time to failure being an amount of time for an amplitude of a signal on the medium to degrade beyond a predetermined failure criteria. A time to failure without a stress magnetic field is determined based on the corresponding times to failure determined for each of the different stress currents.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.