Patent · US Expired

Systems and methods for pairwise analysis of event data

US6697802B2 · kind B2 · utility

31Cited by
3References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 12, 2001
Grant dateFeb 24, 2004
Priority date
Expiry dateJan 15, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99936
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Techniques for mining or discovering one or more patterns in an input data set, wherein the input data set is characterized by attributes, comprises the following steps. First, the technique includes mapping attributes of the input data set to mapping values. Then, one or more candidate patterns are formed as groupings of two mapping values that occur within a predefined time period. Next, for each of the one or more candidate patterns, a qualification function is computed and a result of the qualification function is compared with at least one predefined threshold value. The one or more candidate patterns whose qualification function results are greater than or equal to the predefined threshold value are identified as one or more qualified patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.