Patent · US Expired

Method and apparatus for monitoring polishing plate condition

US6702646B1 · kind B1 · utility

19Cited by
33References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 2002
Grant dateMar 9, 2004
Priority date
Expiry dateJul 1, 2022

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/10
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An apparatus for monitoring a condition of a polishing plate, in particular for detecting the time for the polishing plate to be reconditioned or replaced, comprising a measuring unit containing at least one sensing unit and a signal-conditioning unit; and a data processing unit. The measuring unit is being in contact with the polishing plate and having a possibility to move relative to it. The sensing unit comprises a probing tip and a set of sensors attached to the back surface of the probing tip, and contains at least one sensor of the group of coefficient of friction sensor, acoustic emission sensor, wear sensor. All sensors work simultaneously and their measurement data is processed and analyzed by a data processing unit for obtaining accurate and reliable results.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.