Method and apparatus for generating improved daughter-ion spectra using time-of-flight mass spectrometers
US6703608B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2001 |
| Grant date | Mar 9, 2004 |
| Priority date | — |
| Expiry date | Dec 13, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention relates to methods and instruments for measuring daughter-ion spectra (also known as fragment-ion spectra or MS/MS spectra) in time-of-flight mass spectrometers, especially of those with reflectors, with post acceleration of selected parent and daughter ions by raising the potential of a “potential lift” during the passage of the ions. The invention consists of a potential lift device which is equipped with a power supply for velocity spread focusing by delayed acceleration of the ions after lifting the potential, thus making it possible to produce a focus of the velocity spreads of ions at the detector. In addition, it is possible to facilitate the adjustment of the mass spectrometer by dynamically shaping the acceleration pulse of the lift device to focus the velocity spreads of all ion masses in the spectrum on the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.