Method and apparatus for correcting heavily damaged images
US6704458B2 · kind B2 · utility
5Cited by
77References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 12, 2000 |
| Grant date | Mar 9, 2004 |
| Priority date | — |
| Expiry date | May 24, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T5/77
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for correcting defects in images. A secondary defect map, defining heavily damaged portions of the image which were not corrected automatically, is generated. The secondary defect map allows the user to correct the defects by highlighting the uncorrected areas. Once the secondary defect map is generated, if the user selects the defect, it is filled in with a correction value obtained from surrounding “good” pixels only, rather than all the pixels—corrected and uncorrected—in a surrounding area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.