Systems and methods for wideband active probing of devices and circuits in operation
US6704670B2 · kind B2 · utility
22Cited by
4References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 16, 2002 |
| Grant date | Mar 9, 2004 |
| Priority date | — |
| Expiry date | Jul 9, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for wideband active probing of devices and circuits in operation are provided. One such embodiment includes a probe amplifier housing that at least partially contains a probe amplifier circuitry. The probe amplifier circuitry and the probe housing are configured to be separately arranged and positioned from connected probing and signal monitoring apparatuses. Methods are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.