Patent · US Expired

Hot plug interface (HPI) test fixture

US6704827B1 · kind B1 · utility

9Cited by
5References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2001
Grant dateMar 9, 2004
Priority date
Expiry dateAug 6, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2733
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method is provided, the method comprising testing at least one hot-pluggable peripheral hardware device and a computer system by simulating hot-plugging the at least one hot-pluggable peripheral hardware device using a test fixture inserted between the computer system and the at least one hot-pluggable peripheral hardware device. The method also comprises monitoring at least one effect of testing the at least one hot-pluggable peripheral hardware device and the computer system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.