Patent · US Expired

Apparatus and method to dice integrated circuits from a wafer using a pressurized jet

US6705925B1 · kind B1 · utility

19Cited by
29References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 2001
Grant dateMar 16, 2004
Priority date
Expiry dateSep 12, 2021

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24C1/045
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An apparatus and method to cut irregularly shaped dice from a wafer using a fluid jet cutting system. One embodiment of the invention involves a method to cut irregularly shaped dice from a wafer, such as planar light-wave circuit device. The method includes placing a wafer on a fixture; aligning the wafer in the fixture to expose the dice to a fluid jet cutting nozzle; supplying an abrasive to the fluid jet cutting nozzle; supplying a pressurized fluid to the fluid jet cutting nozzle expelling the abrasive in combination with the fluid from the fluid jet cutting nozzle at a velocity sufficient to cut through the wafer, while the fluid jet cutting nozzle moves in relation to the wafer in the fixture; and removing the dice from the fixture after the dice have been cut from the wafer. A second embodiment of the invention is directed to an apparatus to provide a wafer die cutting system to cut a wafer. The apparatus includes a fixture to align and hold the wafer; a cutting nozzle to expel a fluid and an abrasive towards the wafer at a velocity sufficient to cut through the wafer; a fluid source to supply the fluid to the cutting nozzle; an abrasive source to supply the abrasive to the…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.