Patent · US Expired

On-chip analysis of particles and fractionation of particle mixtures using light-controlled electrokinetic assembly of particles near surfaces

US6706163B2 · kind B2 · utility

55Cited by
22References
30Claims
0Family size

Inventors

Key dates

Filing dateMar 21, 2001
Grant dateMar 16, 2004
Priority date
Expiry dateMar 21, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/0294
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for fractionation of a mixture of particles and for particle analysis are provided, in which LEAPS (“Light-controlled Electrokinetic Assembly of Particles near Surfaces”) is used to fractionate and analyze a plurality of particles suspended in an interface between an electrode and an electrolyte solution. A mixture of particles are fractionated according to their relaxation frequencies, which in turn reflect differences in size or surface composition of the particles. Particles may also be analyzed to determine their physical and chemical properties based on particle relaxation frequency and maximal velocity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.