Method and system for estimating sensor dark current drift and sensor/illumination non-uniformities
US6707557B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 2, 2001 |
| Grant date | Mar 16, 2004 |
| Priority date | — |
| Expiry date | Apr 8, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/0408
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
One aspect of the present invention is a system for estimating sensor and illumination non-uniformities. The system comprises a first light source, and a first sensor operable to capture light reflected from a first side of film illuminated by the light source while the film has a developer chemical applied thereto and processing circuitry coupled to the first sensor. The processing circuitry is operable to capture a first plurality of readings from the sensor responsive to light reflected from an unexposed region of film to determine a first set of non-uniformity data and adjust image data obtained from the film in response to the first set of non-uniformity data. In a further embodiment, the processing circuitry is further operable to dim the first light source for at least a portion of the time that the sensor is being used to sense the unexposed region of the film. The processing circuitry may also capture a second plurality of readings from the sensor while the first light source is dimmed to determine a second set of non-uniformity data and adjust image data obtained from the film in response to the second set of non-uniformity data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.