Patent · US Expired

Device for measuring gas concentration

US6710347B1 · kind B1 · utility

4Cited by
7References
31Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 12, 2002
Grant dateMar 23, 2004
Priority date
Expiry dateMar 12, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/1218
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for detecting at least one component gas in a sample includes a radiation source for providing radiation along an optical path in a pre-selected spectral band having at least one absorption line of the component gas to be detected and an optical detector for detecting radiation at the optical path. A sample chamber is positioned in the optical path between the source and the optical detector to contain a quantity of a sample gas. At least one gas cell enclosing an amount of the gas to be detected is fixedly positioned in the optical path in series with the gas chamber. A mathematical relationship is determined between the detected radiation and the concentration of a sample gas filling the sample chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.