Patent · US Expired

Method and device for measuring luminescence

US6710870B1 · kind B1 · utility

29Cited by

5References

10Claims

0Family size

Assignee

Novartis AG · CH

Inventors

Gerd Marowsky · Göttingen, DE
Dieter Neuschaefer · Muttenz, CH
Michael Pawlak · Laufenbürg, DE

Key dates

Filing date	Aug 3, 2000
Grant date	Mar 23, 2004
Priority date	—
Expiry date	Aug 3, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/76
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method exites and determines a luminescence in an analyte sample which is located in contact with the waveguiding layer of an optical layer waveguide. The luminescence is generated by non-evanescent excitation in the volume of the analyte sample. Luminescence radiation generated in the immediate proximity of the surface of the waveguiding layer is conducted to a measuring device and determined after penetrating the waveguiding layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.