Scanning microscope

US6710918B2 · kind B2 · utility

Assignee

• Leica Microsystems Heidelberg GmbH · DE

Inventors

• Holger Birk · Meckesheim, DE
• Rafael Storz · Heidelberg, DE
• Johann Engelhardt · Bad Schönborn, DE
• Kyra Moellmann · Trippstadt, DE

Key dates

• Filing date: Jun 18, 2001
• Grant date: Mar 23, 2004
• Expiry date: Jun 18, 2021

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01S3/1636
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

The invention discloses a scanning microscope (1) having a laser (2), which emits a light beam of a first wavelength (5, 43, 53) and is directed onto an optical element (9) that modifies the wavelength of the light beam at least to some extent. Means (16) for suppressing the light of the first wavelength in the modified-wavelength light beam (5, 47, 57) are provided.