Method of sensing temperature of a digital X-ray imaging system
US6713769B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2002 |
| Grant date | Mar 30, 2004 |
| Priority date | — |
| Expiry date | Jun 14, 2022 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/4488
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An X-ray imaging system that utilizes the leakage, or dark current, of a detector panel's photodiodes to provide more accurate data about the temperature and spatial distribution of temperature of the X-ray detector panel. Offset images are taken at known temperatures and recorded for each photodiode at two or more known temperatures. A temperature versus offset image value curve is the created for each photodiode. A second offset image value is determined immediately prior to or immediately after X-ray acquisition to determine the temperature of the detector panel at the time of X-ray acquisition. A coupled closed-loop cooling system utilizes the determined temperature to maintain the detector panel within a preferred temperature range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.