Use of light scattering particles in design, manufacture, and quality control of small volume instruments, devices, and processes
US6714299B2 · kind B2 · utility
25Cited by
2References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 13, 2001 |
| Grant date | Mar 30, 2004 |
| Priority date | — |
| Expiry date | Jul 13, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1486
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The use of light scattering particles in the design, manufacturing, and quality control of microscale devices and process, and the analysis of solid substrate and porous substrate characteristics is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.