Patent · US Expired

Method and system for adaptive sampling testing of assemblies

US6716652B1 · kind B1 · utility

18Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2002
Grant dateApr 6, 2004
Priority date
Expiry dateJun 21, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B23/0256
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A testing processor executes a plurality of test steps of an assembly test on successive units. A server informs the testing processor of a sampling frequency for each test step. The testing processor only executes those test steps whose sampling frequencies indicate that they are to be run on a particular unit. Upon detecting a failure associated with a particular test step, the server may inform the testing processor to adjust the sampling frequency of the particular test step such that the particular test step is to be executed on every subsequent unit to be tested. Upon receiving no further failures associated with the particular test step for a given number of units, the server may notify the testing processor to adjust the sampling frequency of the particular test step such that it need not be executed for every subsequent unit to be tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.