Patent · US Expired

Semiconductor device and the manufacturing method thereof

US6717243B2 · kind B2 · utility

4Cited by
6References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2002
Grant dateApr 6, 2004
Priority date
Expiry dateJun 28, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19043
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device has a bump electrode formed on a flat surface of a passivation film of the device. The bump electrode is connected to a top wiring layer through a plurality of openings in the passivation film underneath the bump electrode, which are filled with a conductive material. The bump electrode is formed away from via holes, which connects the top wiring layer for the bump electrode and a lower wiring layer connected to source and drain layers of the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.