Monolithic I-load architecture for automatic test equipment
US6717450B1 · kind B1 · utility
4Cited by
5References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 13, 2002 |
| Grant date | Apr 6, 2004 |
| Priority date | — |
| Expiry date | Aug 28, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An active load circuit for automatic test equipment that tests integrated circuits. The active load circuit includes a current source; a current sink; a current switching switching circuit having current source and current sink nodes respectively connected to the current source and the current sink; and a control circuit for controlling the current switching circuit with a differential voltage that is limited in amplitude and of the same polarity as a voltage difference between a fixed reference voltage and a pin output voltage of a device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.