Patent · US Expired

Method and apparatus for detecting failure in solar cell module, and solar cell module

US6717519B2 · kind B2 · utility

14Cited by
11References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 21, 2002
Grant dateApr 6, 2004
Priority date
Expiry dateOct 21, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/50
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The temperature of a bypass diode of a solar cell module is measured by a temperature detector from the exterior of the solar cell module, and the results of temperature detection of each bypass diode are mutually compared to detect the presence or absence of failure in the solar cell module. Also at least one solar cell in the solar cell module is covered with a light shielding plate, then a current flowing in the bypass diode bypassing to the covered solar cell is detected, and a failed solar cell module is detected from the result of the current detection. Also the solar cell module is provided with a temperature detector capable of detecting the temperature of the bypass diode and the temperature of an internal portion of the solar cell module other than the bypass diode. In this way, it is possible to detect a failure in the solar cell module easily and precisely, and also to detect short circuit failure in the solar cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.