Optical configuration and method for differential refractive index measurements
US6717663B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 2002 |
| Grant date | Apr 6, 2004 |
| Priority date | — |
| Expiry date | Mar 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/4133
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical configuration for differential refractive index measurements of a test sample relative to a reference sample comprises an optical path along which an illumination beam travels to simultaneously illuminate a pair of optical interfaces on opposite sides of a meridional plane corresponding to the test sample and reference sample, respectively. Partial beams leaving the optical interfaces are optically diverged to illuminate different segments of a linear scanned array aligned in the meridional plane. The difference in location of a pair of shadowlines or a pair of resonance minimums formed by the partial beams on the array provides an indication of the refractive index difference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.