Method and apparatus for measuring nitrogen in a gas
US6717666B2 · kind B2 · utility
5Cited by
3References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2002 |
| Grant date | Apr 6, 2004 |
| Priority date | — |
| Expiry date | Mar 18, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/69
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method and an apparatus for analyzing nitrogen in a gas, in which the concentration of nitrogen can be continuously measured with good sensitivity without wasting a sample gas.At least one wavelength for measuring a concentration of nitrogen according to the intensity of a light generated by discharge, is selected from a group consisting of 215±2 nm, 226±2 nm, 238±2 nm, 242±2 nm, 246±1 nm, 256±2 nm, 260±2 nm, 266±2 nm, 271±1 nm, 276±4 nm, 285±2 nm, 294±1 nm, and 300±2 nm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.