Semiconductor characterization and production information system
US6720194B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 2002 |
| Grant date | Apr 13, 2004 |
| Priority date | — |
| Expiry date | Oct 2, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A system in accordance with the present invention provides characterization information for semiconductor products. The system includes a plurality of data sources, each providing data pertaining to the products. A server is coupleable to each data source. A database is coupled to the server for storing data from the data sources. An automatic data collection engine at the server automatically collects data from the sources. A characterization engine resident at the server operates on the data to provide characterization information. A reporting application engine operable at the server generates characterization reports from the characterization information. The characterization reports are selectable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.