Optical sampling waveform measuring apparatus aiming at achieving wider band
US6720548B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 12, 2002 |
| Grant date | Apr 13, 2004 |
| Priority date | — |
| Expiry date | Aug 31, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/3534
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A nonlinear optical crystal is composed of 2-adamantyl-5-nitorpyridine (AANP) allowing the type 2 phase matching to the sampling light and a measuring object light, emitting a sum frequency light of the measuring object light and the sampling light, with the polarization directions thereof being perpendicular to each other, when the sampling light and measuring object light multiplexed by a multiplexer are entered. When the sum frequency light is emitted through the nonlinear optical crystal, a control portion controls the polarization direction of the sampling light so as to be parallel to a predetermined reference axis located within a plane perpendicular to a phase matching direction of the nonlinear optical crystal. The predetermined reference axis is a single axis maintaining parallelism with the crystal axis of the nonlinear optical crystal even if the wavelength of the inputted light is changed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.