Pulsed eddy current two-dimensional sensor array inspection probe and system
US6720775B2 · kind B2 · utility
14Cited by
14References
16Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 12, 2001 |
| Grant date | Apr 13, 2004 |
| Priority date | — |
| Expiry date | Jun 12, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.