Patent · US Expired

Circuit board tester probe system

US6720781B2 · kind B2 · utility

15Cited by

7References

42Claims

0Family size

Assignee

atg test systems GmbH & Co. KG · DE

Inventors

Bernd Ott · Künzelsau, DE
Manfred Prokopp · Wertheim, DE

Key dates

Filing date	Apr 19, 2002
Grant date	Apr 13, 2004
Priority date	—
Expiry date	Apr 19, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06722
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.