Method and apparatus for determining the reflectance of translucent objects
US6721054B1 · kind B1 · utility
5Cited by
7References
20Claims
0Family size
Inventor
Key dates
| Filing date | Oct 11, 2001 |
| Grant date | Apr 13, 2004 |
| Priority date | — |
| Expiry date | Oct 11, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for accurately measuring the reflectance of translucent objects by illuminating small areas of the object is disclosed. The method involves determining the lateral diffusion error by use of a predetermined set of calibration standards. The lateral diffusion error is added to the uncorrected reflectance to produce the corrected reflectance value. The method has widespread potential applications in the paper, printing, textile, coating, and food industries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.