Patent · US Expired

Method of producing structured wafers

US6723250B1 · kind B1 · utility

3Cited by
13References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 27, 1999
Grant dateApr 20, 2004
Priority date
Expiry dateJan 27, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/958
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of producing structured wafers guarantees that the edge of the wafer will be protected from attack by an aggressive etchant medium without applying a photoresist to the edge and without using additional mechanical measures. In a type of negative process, a passivation layer is applied to the areas that are not to be structured, including the edge area of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.