Method of producing structured wafers
US6723250B1 · kind B1 · utility
3Cited by
13References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 27, 1999 |
| Grant date | Apr 20, 2004 |
| Priority date | — |
| Expiry date | Jan 27, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/958
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
A method of producing structured wafers guarantees that the edge of the wafer will be protected from attack by an aggressive etchant medium without applying a photoresist to the edge and without using additional mechanical measures. In a type of negative process, a passivation layer is applied to the areas that are not to be structured, including the edge area of the wafer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.