Patent · US Expired

Systems and methods for tagging measurement values

US6725172B2 · kind B2 · utility

2Cited by
2References
52Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 17, 2002
Grant dateApr 20, 2004
Priority date
Expiry dateMay 28, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R13/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems and methods for measuring a characteristic of an analog signal are provided. A system for measuring a characteristic of an analog signal includes an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value, and logic that is configured to associate a data tag with the data value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.