Capacitance skip write detector
US6728050B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 5, 2001 |
| Grant date | Apr 27, 2004 |
| Priority date | — |
| Expiry date | Feb 10, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention offers an apparatus and associated method to detect a skip write error occurring during a data storage device write process. The capacitance between the read/write head and the disc surface, called the “parasitic capacitance,” is used to determine whether a skip write error has occurred. The amount of parasitic capacitance is determined by monitoring the frequency change at the input of an oscillator of test circuit. A change in the read/write head fly height causes a change in the parasitic capacitance and a corresponding change in the frequency. The parasitic capacitance is compared to a threshold limit to determine whether a skip write error has occurred. The write operation is suspended when a skip write error is detected and a rewrite procedure is instituted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.