Patent · US Expired

Wafer-level coated copper stud bumps

US6731003B2 · kind B2 · utility

165Cited by
21References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2003
Grant dateMay 4, 2004
Priority date
Expiry dateMar 11, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19043
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a semiconductor die package is disclosed. In one embodiment, the method includes forming a semiconductor die comprising a semiconductor device. A plurality of copper bumps is formed on the semiconductor die using a plating process. An adhesion layer is formed on each of the copper bumps, and a noble metal layer is formed on each of the copper bumps.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.