Measurement probe system with EOS/ESD protection
US6731104B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 5, 2002 |
| Grant date | May 4, 2004 |
| Priority date | — |
| Expiry date | Dec 5, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement probing system has a measurement probe having a housing, spring loaded coaxial probe assembly and a pressure sensor that generates a resistive activation signal in response to movement of the housing in relation to the spring loaded coaxial probe assembly. The activation signal is applied to control circuitry in a control module for generating an output signal to drive an RF relay to couple the probing tip of the measurement probe from electrical to input circuitry of a measurement test instrument. The control circuitry further includes a TTL buffer circuit for generating the output signal in response to a TTL logic signal from a controller for automated testing of a device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.