Patent · US Expired

Method and arrangement for testing the stability of a working point of a circuit

US6732337B1 · kind B1 · utility

1Cited by

4References

12Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Rolf Neubert · Unterhaching, DE
Qinghua Zheng · San Jose, US

Key dates

Filing date	Mar 1, 2001
Grant date	May 4, 2004
Priority date	—
Expiry date	Mar 1, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2837
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A DC transfer curve of a circuit is determined for determining the global dynamics of a circuit and a stability analysis is conducted for points of the DC transfer curve. The results of the stability analysis are at least one stable region and at least one unstable region of the DC transfer curve. This makes it possible to determine sensitivity, speed and process tolerance of the circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.