System and method for classification of defects in a manufactured object
US6732587B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2002 |
| Grant date | May 11, 2004 |
| Priority date | — |
| Expiry date | Mar 31, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/044
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Ultrasonic testing techniques may involve the measurement of ultrasonic waves from the tested part. These waves may reflect from surfaces of various layers within the part. Further, these waves may reflect from faults, defects, voids, fractures, and others. As such, the measured ultrasonic wave is a complex mix of these reflections. One method for detecting flaws, defects, and others may be to express the signal in terms of a set of basis functions. These functions may be summed to produce the measured signal. Further, basis functions may be chosen such that a select set of the basis functions characterize the fault and/or defect. In one exemplary embodiment, the coefficients associated with the basis function may be non-zero when a defect is present. As such, a defect may be detected quickly and automatically.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.