Patent · US Expired

Fetal testing for prediction of low birth weight

US6733967B1 · kind B1 · utility

6Cited by
20References
6Claims
0Family size

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Key dates

Filing dateOct 20, 2000
Grant dateMay 11, 2004
Priority date
Expiry dateOct 20, 2020

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC12Q2600/172
  • WIPO fieldBiotechnology
  • WIPO sectorChemistry

Abstract

Methods, assays and kits are disclosed for detecting a mother's or a fetus's susceptibility to an adverse pregnancy outcome such as low birth weight. The methods comprise obtaining a biological sample from a patient and determining the presence or absence of an IL-1 allele 2 of a marker that is associated with an adverse pregnancy outcome.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.