Patent · US Expired

Time-of-flight mass spectrometer with multiplex operation

US6734421B2 · kind B2 · utility

6Cited by

5References

10Claims

0Family size

Assignee

Bruker Daltonik GmbH · DE

Inventors

Armin Holle · Oyten, DE
Jochen Franzen · Bremen, DE

Key dates

Filing date	Mar 6, 2002
Grant date	May 11, 2004
Priority date	—
Expiry date	Apr 12, 2022

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/40
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

The invention concerns a time-of-flight mass spectrometer for the analysis of a large number of samples on a sample carrier using laser desorption and associated analytical procedures. The invention uses a special beam focusing system for the pulsed laser beam in a time-of-flight mass spectrometer to generate a firm pattern of focal points, inserts a pattern of samples on a sample carrier into the pattern of focal points, and focuses the ions generated in the laser focal points by an ion-optical imaging system onto one or more ion detectors in such a way that the samples in the focus pattern are measured simultaneously or quasi-simultaneously. The pattern of pulsed focal points can be created simultaneously through spatially splitting the beam, or by a temporal sequence of different deflections towards the firm locations of the pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.