Optical configuration and method for differential refractive index measurements
US6734956B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2002 |
| Grant date | May 11, 2004 |
| Priority date | — |
| Expiry date | May 14, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/43
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. A linear scanned array is aligned in a meridional plane of the optical configuration for detection purposes, and an optical multiplexor is provided upstream of the linear scanned array for receiving the first and second partial beams and defining first and second optical channels carrying optical signal information corresponding to the first and second partial beams. The optical multiplexor switches between optical channels, such that the linear scanned array detects either the first or second optical channel at a given time. Thus, differential measurements are possible using a single linear array. Embodiments for critical angle and surface plasmon resonance refractive index measurements are disclosed. The disclosure also relates to methods for measuring a difference in refractive index between a first sample and a second sample in accordance w…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.