Patent · US Expired

Solid supports for analytical measuring processes

US6737024B1 · kind B1 · utility

6Cited by

6References

9Claims

0Family size

Assignee

BASF SE

Inventors

Heinz Eipel · Bensheim, DE
Harald Keller · Ludwigshafen, DE

Key dates

Filing date	Jan 14, 1999
Grant date	May 18, 2004
Priority date	—
Expiry date	Jan 14, 2019

Classification

Technology area (CPC C)Chemistry; Metallurgy
CPC primaryC40B60/14
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to solid supports for analytical measurement methods which are essentially composed of an inert solid support material on which hydrophilic measurement zones, separated from one another by a hydrophobic coating, where at least 10 measurement points are applied to the support per cm2. The invention furthermore relates to a process for producing the supports, and to the use of the supports in diagnostic methods, in research looking for active substances, in combinatorial chemistry, in crop protection, in toxicology or in environmental protection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.