Patent · US Expired

Infrared analysis instrument with offset probe for particulate sample

US6737649B2 · kind B2 · utility

5Cited by
21References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 16, 2002
Grant dateMay 18, 2004
Priority date
Expiry dateApr 16, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/35
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In an infrared analysis instrument, a fiber optic probe, designed to be inserted into a particulate sample, is formed from distal ends of transmitting and receiving optic fibers. The distal ends of the transmitting fibers are located centrally in the probe and the distal ends of the receiving fibers are formed in a ring around the distal ends of the transmitting fibers. The distal ends of the receiving fibers are set back from the distal ends of the transmitting fibers. The receiving fibers carrying diffusely scattered light reflected from and transmitted through the particulate sample to a spectrophotometer housing containing fixed grating and an array of silicon photodetectors arranged to detect the spectrum dispersed by the grating in the range of 500 to 1100 nm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.