Method and apparatus for in-circuit impedance measurement
US6737875B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2001 |
| Grant date | May 18, 2004 |
| Priority date | — |
| Expiry date | Feb 17, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2843
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method for measuring an impedance between first and second nodes in an electrical circuit without removing components includes at least one current source to provide first and second currents or current signals of known values. First and second probes contact the respective first and second nodes to apply the first and second currents. A third common probe contacts the circuit at a common node that experiences the same current flow as between the first and second nodes. At least one voltage meter measures voltages corresponding to the first and second currents. A processor calculates the impedance based on the known values of the currents, and the measured values of the voltages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.