Patent · US Expired

Method for examining a specimen

US6738190B2 · kind B2 · utility

5Cited by

5References

8Claims

0Family size

Assignee

Leica Microsystems Heidelberg GmbH · DE

Inventors

Johann Engelhardt · Bad Schönborn, DE
Juergen Hoffmann · Baden, CH
Werner Knebel · Kronau, DE

Key dates

Filing date	Sep 5, 2001
Grant date	May 18, 2004
Priority date	—
Expiry date	Aug 1, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/008
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen (11) is detected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.