Patent · US Expired

Method of reading stored data and semiconductor memory device

US6738283B2 · kind B2 · utility

10Cited by
4References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2002
Grant dateMay 18, 2004
Priority date
Expiry dateMar 29, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C15/04
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device includes a smaller number of elements. A method for reading stored data within the semiconductor memory device suppresses the reduction in the static noise margin accompanying a voltage drop of a power supply voltage, and improves the degree of integration of the circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.